Product Introduction:
The MP-E series is a functionally advanced probe station, which can examine the electrode/pad size of more than 1μm and can upgrade with test functions at a lower cost.
Product Features:
1.Chuck can be raised and lowered for quick separation of probe from sample;
2.Standard metallographic microscope, Pad test above 1μm;
3.Can be equipped with a laser for FA testing/laser cutting;
4.Microscope pneumatic quick lift, easy to change micro-scope and probe card holder;
5.POMater Adaptive Isolation Base;
6.Adopting shock absorbtion materials imported from Germany to improve test stability.
Product Parameters:
Manual Prober Model |
MP-M4/MP-M6/MP-M6mini |
MP-E4/MP-E6/MP-E8/MP-E12 |
MP-H6/MP-H8/MP-H12 |
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Chuck |
Chuck material |
Stainless Steel/Nickel or gold plated copper |
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Chuck lift |
N/A |
Quick rise 5mm, fine tune 6mm |
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Move quickly |
N/A |
N/A |
√ |
|
Micropositioner platform lift |
N/A |
N/A |
Quick lift 5mm,Fine adjustment 40mm,coarse adjustment 300μm |
|
Microscope |
Standard body microscope (optional video microscope mirror), can be magnified up to 100X |
Standard PSM-1000 metallographic microscope / optional (GX-6 metallographic, stereo, video) microscope,it can be magnified to 2000X，and the microscope can be adjusted up and down by air control |
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Probe specification |
Current leakage |
Coaxial 1pA/V @ 25 °C; Three shaft 100fA/V @ 25 °C; Triaxial 10pA@3kv @25°C, Test conditions: dry environment for grounding shield (air dew point lower than -40°C) |
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Connector type |
Banana head/Alligator clip/Coaxial/Triaxial interface |
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Test application |
DC/(IV, CV) testing Low current (class 100fA) testing 1/f noise test Device Characterization Test WLR, aging test RF test frequency up to 110GHz High power/high current/high voltage test |
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Failure analysis test |
Failure analysis test |
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Guangzhou Minder-Hightech Co.,Ltd.
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