MDHWS661 series ultrasonic scanning microscope is a kind of non-destructive testing imaging equipment using ultrasound as the propagation medium. lt mainly uses high-frequency ultrasound to detect all kinds of semiconductor devices and materials, and can detect the defects such as pores, cracks, inclusions and delamination inside the sample, and display them in a graphical way.
ln the scanning process, it will not cause damage to the sample, will not affect the performance of the sample, and can effectively meet the needs of new energy, semiconductor, power electronics, thermal management materials, diamond composite materials carbon fiber composite materials and other industries.