MDHWS114 Ultrasonic scanning microscope is a non-destructive testing imaging equipment using ultrasound as the media. It mainly uses high-frequency ultrasound to detect all kinds of semiconductor devices and materials, and can detect defects such as holes, cracks, inclusions and delamination inside the sample, and display them in a graphical way.
In the scanning process, it will not cause damage to the sample, will not affect the performance of the sample, and can effectively meet the needs of new energy, semiconductor, power electronics, thermal management materials, diamond composite materials, carbon fiber composite materials and other industries.