Guangzhou Minder-Hightech Co.,Ltd.

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  • High And Low Temperature Wafer Prober
  • High And Low Temperature Wafer Prober

High And Low Temperature Wafer Prober

Product Introduction

HLTP-C series prober has an excellent mechanical system, stable structural performance, intuitive, easy operation, support multi-function upgrade, and rich and compre-hensive functions. This product is mainly used in integrated circuits, LED, LCD, solar cells, semiconductor industry manufacturing, and research.

Product Features

1.Innovative air-operated chuck moving platform;

2.Liftable micropositioner platform;

3.Advanced 3x imaging technology, significantly improving test efficiency;

4.Shielded cavity structure design.

Product Parameters

Model

HLTP-C6

HLTP-C8

HLTP-C12

Chuck

Size

6inch

8inch

12inch

205*205mm

205*205mm

305*305mm

Travel

210mm

210mm

290mm

Minimum displacement

1μm

EMI shielding

Multi-magnification optical system

15:1 three-speed zoom microscope,can display 3 files meanwhile

Temperature

control

characteristics

Range

-60℃~300℃

Resolution

0.01

Minimum temperature control rate

±0.1°C/h

Cooling method

Liquid nitrogen/air

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