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  • High And Low Temperature Vacuum Wafer Prober
  • High And Low Temperature Vacuum Wafer Prober

High And Low Temperature Vacuum Wafer Prober

Product Introduction

MDSM-VP-CG series probe station can provide IV/CV characteristic test, RF test, photoelectric test, electromagnetic transport characteristic, and Hall effect test for device and material characterization in the environment of ultra-high vacuum and high and low temperatures.

By setting up components such as a vacuum chamber and radiation protection screen, integrated high temperature, low temperature, vacuum, and other testing conditions can effectively meet and provide a stable testing environment for semiconductor devices.

Product Features

1.Can support 4.2K-473K temperature

2.Anti-radiation screen design to improve sample temperature uniformity and accuracy

3.Probe heat sink design to ensure accurate probe drop

4.Upgradable loading magnetic field

5.Flexible and scalable test application configuration

6.Automatic refrigerant flow control, automatic precise temperature control

Product Parameters

Model

MDSM-VP-CG-O-2

MDSM-VP-CG-O-4

MDSM-VP-CG-C-2

Chuck

Size

2inch

4inch

2inch

Sample fixing method

Vacuum thermal grease/spring press

Vacuum degree

10^-10torr maximum vacuum

Optical

properties

Microscope travel

R axis 360°+moving axis 100mm

Gain

Zoom: 7:1, resolution 4μm (magnification 216X) or metallographic microscope (20X~1000X)

Dimensions of

observation window

2inch

4inch

2inch

Temperature

control

specifications

CCD pixel

50W(simulation)/200W(digital)/500W(digital)

Cooling method

Liquid nitrogen/liquid helium

Refrigeration Compressors

Control method

Open cycle manual/automatic refrigerant flow control

Closed loop automatic control

Range

77K~473K/4.2K~473K

7.3K~473K

Resolution

0.001K

Stability

4.2K±0.2K 77K±0.1K 373K±0.08K 473K±0.1K

Probe specification

Probe number

The number of various probes can be expanded up to 6

Probe regulation

Vacuum bellows external adjustment, manual control

Dot accuracy

2μm

Current leakage

1pA/V @25℃,100fA/V @25℃

Connector type

Triaxial/SMA/K/Fiber Interface

Inquiry

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